2   Artículos

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en línea
Li Wang, Wenli Chen, Kai Chen, Renjun He and Wenjian Zhou    
In the high-resolution analog circuit, the performance of chips is an important part. The performance of the chips needs to be determined by testing. According to the test requirements, stimulus signal with better quality and performance is necessary. Th... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Ning Sun, Jie Li, Debiao Zhang, Chenjun Hu, Xiaofei Peng, Jie Jiang, Shuai Wang, Zeyu Zhang and Wentao Cui    
The performance of analog-to-digital converters (ADCs) has reached a bottleneck due to the limitations of the manufacturing process and testing environment. Time-interleaved ADC (TIADC) technology can increase the sampling rate without changing the resol... ver más
Revista: Applied Sciences    Formato: Electrónico

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